Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches

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Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches

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ژورنال

عنوان ژورنال: Microelectronics Reliability

سال: 2008

ISSN: 0026-2714

DOI: 10.1016/j.microrel.2008.07.046