Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
نویسندگان
چکیده
منابع مشابه
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
In this work, we investigate the charging and reliability of interlayer dielectric materials that are used in the fabrication process of advanced RF-MEMS switches. In particular, the charge stored on the surface of a dielectric and the dynamic of this charge at Nanometric scale are studied. More attention is given to the decay of the deposited charge by a variety of means: (1) surface conductio...
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2008
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2008.07.046